Stil CMM2 High Res Microphotography

Stil Micromeasure 2 - 3D Measuring System

High Resolution 3D micro topography and to shape and texture analysis. It can be used to measure profiles or surfaces of samples as well as for measuring the thickness of transparent materials.

Features

• MICROTOPOGRAPHY
• ROUGHNESS MEASUREMENT
• FORM AND TEXTURE ANALYSIS
• FINE MECHANICS INSPECTION
• SURFACE CHARACTERIZATION
• DIMENSIONAL METROLOGY

Specifications

• X AND Y AXES 100 mm as standard, 0.1 µm Microstep
• Z AXIS 50mm, 0.05 µm Microstep
• DRIVING SOFTWARE: SurfaceMap
• SENSOR CONTROLLER: CHR150
• OPTICAL PEN: Micrometric 350 µm
• VIDEO CAMERA: VCX250 with integrated illumination

Includes:

• MicroStep CMM2
• 3 axis configuration
• Power supply CMM2-630-NI
• CHR150 Optical sensor CHR2/001-N3
• Dell XPS CPU with Surface Map software
• 1 Optical pen 350 µm
• 1 Camera
• All cables and manuals cd/s