Ando (Yokogawa) AQ6317C Optical Spectrum Analyzer (OSA)

Ando (Yokogawa) AQ6317C Optical Spectrum Analyzer (OSA): High Precision for Complex Optical Testing

The Ando (Yokogawa) AQ6317C Optical Spectrum Analyzer (OSA) is a powerful, dependable tool designed for precision optical testing. This advanced, high-resolution analyzer from Ando is built for rigorous optical measurements, making it ideal for use in telecommunications, research, and fiber optic component testing.

Item : Experience the difference with our Ando Yokogawa AQ6317B Optical Spectrum Analyzer (OSA) - where innovation meets value.

Calibration included

• Calibration to OEM specification
• Calibration Certificate
• Calibration Label
• Calibration Data

Precision Engineering for Reliable Optical Testing

Ando’s reputation for quality engineering shines in the AQ6317C’s performance and reliability. The refurbished AQ6317C is not only tested to meet industry standards but also enhanced with upgraded components to provide dependable and accurate measurements. From WDM waveform assessments to EDFA gain measurements, this spectrum analyzer delivers exceptional value in every function.

Versatile Applications for Comprehensive Testing

The Ando AQ6317C is specifically designed to meet the needs of various optical applications. With its high-resolution capabilities, it is particularly suited for analyzing optical fiber amplifiers, WDM signals, and fiber grating notch widths. It also supports long-term function display options, making it adaptable for both single-channel and multi-channel testing environments.

Specifications of the Ando (Yokogawa) AQ6317C Refurbished Optical Spectrum Analyzer (OSA)

Differences Between Ando (Yokogawa) AQ6317B and AQ6317C Optical Spectrum Analyzers (OSA)

The primary differences between the Ando (Yokogawa) AQ6317B and AQ6317C Optical Spectrum Analyzers (OSAs) are related to performance enhancements, precision, and functionality in the AQ6317C model. Here are the key differences:

• Wavelength Accuracy: The AQ6317C has improved wavelength accuracy (±0.02 nm) over the AQ6317B, enabling more precise measurements essential for tasks such as WDM signal analysis.
• Display and Visualization: The AQ6317C features a larger 9.4-inch color display, which provides clearer data visualization and a more user-friendly experience compared to the AQ6317B's smaller display.
• Measurement Speed: The AQ6317C supports faster measurement speeds, allowing for quicker data processing and analysis, making it better suited for applications requiring high throughput.
• Polarization Dependency: The AQ6317C has a reduced polarization dependency, which means it provides more consistent readings regardless of polarization, whereas the AQ6317B has a higher dependency on polarization.
• Trace Memory: The AQ6317C offers three individual trace memory slots, allowing users to store and compare multiple data sets simultaneously, a feature that is more limited in the AQ6317B.
• Pulsed Light Measurement: The AQ6317C is designed to handle pulsed light measurements, making it more versatile in analyzing different types of light sources. The AQ6317B lacks this capability.
• Synchronous Sweep Function: The AQ6317C includes a synchronous sweep function, which is beneficial for advanced WDM and EDFA (Erbium-Doped Fiber Amplifier) analysis. This feature enhances the precision of spectral analysis beyond what the AQ6317B can offer.
• Dynamic Range and Sensitivity: The AQ6317C is optimized for a wider dynamic range and higher sensitivity, making it suitable for applications that require high precision at low signal levels, an area where the AQ6317B may fall short.

These upgrades make the AQ6317C a more advanced and versatile choice for optical spectrum analysis, particularly in applications where precision, speed, and reliability are crucial.